Search results for "Integrated circuit design"
showing 4 items of 4 documents
Improving topological mapping on NoCs
2010
Networks-on-Chip (NoCs) have been proposed as an efficient solution to the complex communications on System-on-chip (SoCs). The design flow of network-on-chip (NoCs) include several key issues, and one of them is the decision of where cores have to be topologically mapped. This thesis proposes a new approach to the topological mapping strategy for NoCs. Concretely, we propose a new topological mapping technique for regular and irregular NoC platforms and its application for optimizing application specific NoC based on distributed and source routing.
Reconfigurable digital instrumentation based on FPGA
2004
A novel application of FPGA to realize digital test equipment is proposed. It takes advantage of the dynamic reconfigurability of FPGAs so easily tailoring custom test functions in the same instrument. This results in high effective, compact and low cost instruments.
A Design Methodology for Low-Power MCML Ring Oscillators
2007
In this paper, a low-power design method for MCML based ring oscillators is presented. The proposed method takes into account the parasitic capacitances of the MOS transistors. To validate it, some ring oscillators with different oscillation frequencies were designed in a 0.18 mum CMOS technology. SPICE simulations demonstrate the effectiveness of the design method.
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location
2015
International audience; The study of the light emitted by transistors in a highly scaled complementary metal oxide semiconductor (CMOS) integrated circuit (IC) has become a key method with which to analyze faulty devices, track the failure root cause, and have candidate locations for where to start the physical analysis. The localization of defective areas in IC corresponds to a reliability check and gives information to the designer to improve the IC design. The scaling of CMOS leads to an increase in the number of active nodes inside the acquisition area. There are also more differences between the spot’s intensities. In order to improve the identification of all of the photon emission sp…